What this workflow helps you do
Compare multiple XRD patterns in one figure to inspect peak-position changes, relative profile shape and sample-to-sample differences. NotyPlot can overlay, stack or normalize diffraction patterns, but the display mode should match the scientific question.
Use this workflow when
- Comparing phases or structural changes across treatments, compositions or processing conditions.
- Showing peak shifts or broadening differences across several diffraction patterns.
- Preparing a labeled multi-pattern XRD figure for discussion or publication.
What you need before you start
- Two or more XRD datasets with known 2θ or other diffraction-angle axes.
- Compatible angle units and sufficiently overlapping scan ranges.
- Sample names and any acquisition differences that affect intensity comparison.
Step-by-step workflow
- Import the XRD patterns and label every dataset with its sample identity.
- Confirm angle units, wavelength context and scan ranges before comparing peak positions.
- Choose overlay for direct alignment or stacking when overlapping traces are difficult to read.
- Use normalization only when relative profile shape is the target; retain raw-intensity context when absolute differences matter.
- Inspect peak shifts, broadening and unmatched features without assigning phases from visual similarity alone.
- Export the comparison with a clear legend and document offsets, normalization and relevant acquisition differences.
What to review in the result
- Peak positions are compared on the same angle scale.
- Normalization or offsets are clearly treated as display transformations.
- Apparent intensity differences are not over-interpreted when acquisition conditions differ.
- Labels and line styles make each sample unambiguous.
Before you report or export
- Report radiation wavelength or instrument conditions when they matter to the comparison.
- Keep raw patterns available when normalized traces are shown.
- Use phase-identification evidence, not only visual alignment, before naming crystalline phases.
Limitations and interpretation
- A shifted peak may reflect several causes; the comparison plot alone does not determine the mechanism.
- Relative intensities can change with preferred orientation, sample preparation and instrument geometry.
- Normalization makes patterns easier to compare visually but removes absolute-intensity information.