Task-focused Workflow

Automatic XRD Peak Analysis in NotyPlot

Run a guided XRD analysis in NotyPlot, inspect detected peaks and fits, and review the results supported by your diffraction pattern.

NotyPlot: Scientific Plotting & Peak Analysis XRD auto analysis
Start this workflow
InputAn XRD intensity pattern with a known angle axis and acquisition details.
OutputReviewable XRD analysis results and a plotted pattern.

Workflow

  1. Import the XRD pattern and verify angle, intensity and dataset identity.
  2. Review baseline, detection sensitivity, wavelength and instrument-broadening settings relevant to the intended analysis.
  3. Run automatic analysis to detect candidate peaks and fit the strongest suitable features.
  4. Inspect peak positions, fitted curves and FWHM values against the measured pattern.
  5. Reject or refit questionable peaks, especially in noisy, broad or overlapping regions.
  6. Continue to the specific workflow you need—such as Scherrer, Williamson–Hall or publication plotting—using only reviewed results.

What this workflow helps you do

Run a guided automatic XRD peak-analysis pass, then review the detected and fitted results rather than treating automation as a final interpretation. The workflow is designed to shorten setup while keeping peak selection, fitting and scientific checks visible.

Use this workflow when

  • Getting a reviewable first pass over a new XRD pattern.
  • Finding and fitting the strongest diffraction peaks before choosing a more specific XRD workflow.
  • Screening whether the dataset is suitable for crystallite-size or other peak-based analysis.

What you need before you start

  • An XRD pattern with a known diffraction-angle axis.
  • Correct wavelength and relevant instrument information when width-based calculations may follow.
  • Enough signal-to-noise and scan resolution for meaningful peak detection.

Step-by-step workflow

  1. Import the XRD pattern and verify angle, intensity and dataset identity.
  2. Review baseline, detection sensitivity, wavelength and instrument-broadening settings relevant to the intended analysis.
  3. Run automatic analysis to detect candidate peaks and fit the strongest suitable features.
  4. Inspect peak positions, fitted curves and FWHM values against the measured pattern.
  5. Reject or refit questionable peaks, especially in noisy, broad or overlapping regions.
  6. Continue to the specific workflow you need—such as Scherrer, Williamson–Hall or publication plotting—using only reviewed results.

What to review in the result

  • Detected peaks correspond to visible diffraction features.
  • Fitted profiles are plausible across the measured peak shapes.
  • Instrument and wavelength settings are appropriate before any physical size/strain calculation.
  • Automation warnings or weak fits are resolved rather than ignored.

Before you report or export

  • Treat automatic analysis as a starting point for expert review.
  • Keep raw data and processing settings with exported results.
  • Use dedicated workflows for phase identification, crystallite size, strain or crystallinity rather than inferring them from a generic peak list.

Limitations and interpretation

  • Automatic peak detection can miss weak peaks or include noise depending on data quality and sensitivity.
  • Overlapping or strongly asymmetric peaks may require closer fit review.
  • The workflow does not turn a peak list into a confirmed phase assignment or material mechanism.

Continue your work

Start this workflow

This opens NotyPlot: Scientific Plotting & Peak Analysis in Workflow mode. The Tool / Workflow toggle remains available in the toolbar.

Start this workflow